ChipVORX

Testonica was founded back in Oct 2005 when several fresh PhD graduates decided to convert their R&D experience into industrial technologies and products, which turned out to be very hard as the dreams were ambitious while commercial and industrial skills were missing. Still, the hard work and everyday learning by trial and error yielded their sweet fruits and made us finally see the great bright future coming!

26 February 2019, at embedded world exhibition in Nürnberg, ChipVORX-SI (Synthetic Instruments), a technology jointly developed by Testonica and GÖPEL electronic has received a prestigious embedded award in tools category. ChipVORX-SI allows configuring a test design for FPGAs easily and without developer knowledge - this convinced the jury of the embedded award 2019.

Marginal Defects, such as excessive voids in solder joints, dewetting, head-in-pillow and alike do not necessarily cause malfunctions, but may result in system performance issues, increased error rates, intermittent faults and other sporadic stability issues observed in certain operation modes, at certain workloads or manifesting in a seemingly stochastic manner. As a result, Marginal Defects may lead to No Fault/Trouble Found (NFF/NTF) scenarios.

In its Aug-Sept issue, IEEE Instrumentation & Measurement Magazine published our technical paper that was originally presented last year at AUTOTESTCON conference in Anaheim, CA. It is one of six conference papers selected for the journal on a quality basis out of the total of 80 AUTOTESTCON'2016 contributions.

The delivered solution enables quality evaluation of up to 10Gbit serial buses (PCIe Gen1/2/3, SATA, optical fiber channel, etc) with a help of powerful FPGA-embedded instrumentation technology. The technology is capable to measure Bit-Error Rate (BER) characteristic for high-speed digital data transmission links as well as to plot so-called BER eye diagram. The latter feature directly fits for mass-production testing since allows every manufactured product to be quickly checked for potential problems on high-speed channels.

Testonica Lab has released universal virtual embedded instrument IP capable to measure frequencies of high-speed clock signals connected to FPGA device. The developed technology offers an easy way of checking frequencies of on-board oscillators without the need of using any kind of external test and measurement equipment. The method does not involve usage of external nail probes or any other means of physical access to oscillator’s pin.

Artur Jutman, 10^th of November, Munich, exhibition grounds. "This is absolutely fantastic" - a typical feedback that I pleasantly hear from respected audience as we are displaying our Flash Accelerator IP and accompanyig software at the GOEPEL booth A1.351.

To be correct, GOEPEL electronic, a Jena, Germany based company is displaying the first ChipVORX^® product (an ultra fast flash programmer) that we at Testonica Lab have proudly developed in very tight cooperation with GOEPEL electronic's engineers.

GOEPEL electronic, world-class vendor of JTAG/Boundary Scan solutions announces the first product based on its new ChipVORX^® technology at the International Test Conference (ITC'2010) in Austin, TX, USA. The new ChipVORX^® based embedded instrumentation solution, developed in cooperation with the Tallinn/Estonia based Company Testonica Lab within the frame of the GATE alliance, is structured modularly as a set of ChipVORX^® models and intelligent IPs.

At the International Test Conference (ITC'2010) in Austin, TX, USA, GOEPEL electronic, world-class vendor of JTAG/Boundary Scan solutions announces the development of a new ChipVORX^® technology enabling support of embedded test instrumentation in connection with JTAG/Boundary Scan.