We are proud to announce a new JTAG-operated embedded instrument for Bit-Error Rate Testing (BERT) of high-speed links on your UltrascalePlus-based products. The lightning-fast QI BERT instrument fits series/mass production scenarios whereas each and every PCBA can be checked for link quality issues using BER Eye diagrams. The latter is especially useful to identify those boards that albeit their correct operation in functional mode, still exhibit the signs of poor signal quality (due to presence of hidden defects).
The delivered solution enables quality evaluation of up to 10Gbit serial buses (PCIe Gen1/2/3, SATA, optical fiber channel, etc) with a help of powerful FPGA-embedded instrumentation technology. The technology is capable to measure Bit-Error Rate (BER) characteristic for high-speed digital data transmission links as well as to plot so-called BER eye diagram. The latter feature directly fits for mass-production testing since allows every manufactured product to be quickly checked for potential problems on high-speed channels.